Using haar wavelets for fault detection in technical processes

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Using haar wavelets for fault detection in technical processes. / Mercorelli, Paolo.
In: IFAC-PapersOnLine, Vol. 48, No. 4, 01.06.2015, p. 37-42.

Research output: Journal contributionsConference article in journalResearchpeer-review

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Mercorelli P. Using haar wavelets for fault detection in technical processes. IFAC-PapersOnLine. 2015 Jun 1;48(4):37-42. doi: 10.1016/j.ifacol.2015.07.004

Bibtex

@article{9ce28b0ce0da48849af2993da55faca3,
title = "Using haar wavelets for fault detection in technical processes",
abstract = "This paper deals with Gross Error Detection using a signal-based approach and proposes an algorithm to be applied in industrial processes. The developed algorithm is used in some industrial software platforms to detect sensor outliers. A validation of this algorithm through computer simulations is shown. Results using real sensor measurements from industrial processes are reported at the end of the paper.",
keywords = "Engineering, Algorithms, Embedded systems, Process control, Gross error detection, Haar wavelets, Industrial processs, Industrial software, Sensor measurements, Technical process",
author = "Paolo Mercorelli",
year = "2015",
month = jun,
day = "1",
doi = "10.1016/j.ifacol.2015.07.004",
language = "English",
volume = "48",
pages = "37--42",
journal = "IFAC-PapersOnLine",
issn = "2405-8971",
publisher = "Elsevier B.V.",
number = "4",
note = "13th IFAC and IEEE Conference on Programmable Devices and Embedded Systems - PDES 2015, PDES Conference 2015 ; Conference date: 13-05-2015 Through 15-05-2015",
url = "http://pdes.polsl.pl/, https://www.ifac-control.org/events/programmable-devices-and-embedded-systems-13th-pdes-2015",

}

RIS

TY - JOUR

T1 - Using haar wavelets for fault detection in technical processes

AU - Mercorelli, Paolo

N1 - Conference code: 13

PY - 2015/6/1

Y1 - 2015/6/1

N2 - This paper deals with Gross Error Detection using a signal-based approach and proposes an algorithm to be applied in industrial processes. The developed algorithm is used in some industrial software platforms to detect sensor outliers. A validation of this algorithm through computer simulations is shown. Results using real sensor measurements from industrial processes are reported at the end of the paper.

AB - This paper deals with Gross Error Detection using a signal-based approach and proposes an algorithm to be applied in industrial processes. The developed algorithm is used in some industrial software platforms to detect sensor outliers. A validation of this algorithm through computer simulations is shown. Results using real sensor measurements from industrial processes are reported at the end of the paper.

KW - Engineering

KW - Algorithms

KW - Embedded systems

KW - Process control

KW - Gross error detection

KW - Haar wavelets

KW - Industrial processs

KW - Industrial software

KW - Sensor measurements

KW - Technical process

UR - http://www.scopus.com/inward/record.url?scp=84954176179&partnerID=8YFLogxK

U2 - 10.1016/j.ifacol.2015.07.004

DO - 10.1016/j.ifacol.2015.07.004

M3 - Conference article in journal

VL - 48

SP - 37

EP - 42

JO - IFAC-PapersOnLine

JF - IFAC-PapersOnLine

SN - 2405-8971

IS - 4

T2 - 13th IFAC and IEEE Conference on Programmable Devices and Embedded Systems - PDES 2015

Y2 - 13 May 2015 through 15 May 2015

ER -

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