TY - JOUR

T1 - Using haar wavelets for fault detection in technical processes

AU - Mercorelli, Paolo

N1 - Conference code: 13

PY - 2015/6/1

Y1 - 2015/6/1

N2 - This paper deals with Gross Error Detection using a signal-based approach and proposes an algorithm to be applied in industrial processes. The developed algorithm is used in some industrial software platforms to detect sensor outliers. A validation of this algorithm through computer simulations is shown. Results using real sensor measurements from industrial processes are reported at the end of the paper.

AB - This paper deals with Gross Error Detection using a signal-based approach and proposes an algorithm to be applied in industrial processes. The developed algorithm is used in some industrial software platforms to detect sensor outliers. A validation of this algorithm through computer simulations is shown. Results using real sensor measurements from industrial processes are reported at the end of the paper.

KW - Engineering

KW - Algorithms

KW - Embedded systems

KW - Process control

KW - Gross error detection

KW - Haar wavelets

KW - Industrial processs

KW - Industrial software

KW - Sensor measurements

KW - Technical process

UR - http://www.scopus.com/inward/record.url?scp=84954176179&partnerID=8YFLogxK

U2 - 10.1016/j.ifacol.2015.07.004

DO - 10.1016/j.ifacol.2015.07.004

M3 - Conference article in journal

VL - 48

SP - 37

EP - 42

JO - IFAC-PapersOnLine

JF - IFAC-PapersOnLine

SN - 2405-8971

IS - 4

T2 - 13th IFAC and IEEE Conference on Programmable Devices and Embedded Systems - PDES 2015

Y2 - 13 May 2015 through 15 May 2015

ER -