Using haar wavelets for fault detection in technical processes

Research output: Journal contributionsConference article in journalResearchpeer-review


This paper deals with Gross Error Detection using a signal-based approach and proposes an algorithm to be applied in industrial processes. The developed algorithm is used in some industrial software platforms to detect sensor outliers. A validation of this algorithm through computer simulations is shown. Results using real sensor measurements from industrial processes are reported at the end of the paper.

Original languageEnglish
JournalIFAC Proceedings Volumes
Issue number4
Pages (from-to)37-42
Number of pages6
Publication statusPublished - 01.06.2015
Event13th IFAC and IEEE Conference on Programmable Devices and Embedded Systems - PDES 2015 - Silesian University of Technology, Krakau, Poland
Duration: 13.05.201515.05.2015
Conference number: 13

    Research areas

  • Engineering - Algorithms, Embedded systems, Process control, Gross error detection, Haar wavelets, Industrial processs, Industrial software, Sensor measurements, Technical process