Using haar wavelets for fault detection in technical processes
Research output: Journal contributions › Conference article in journal › Research › peer-review
Authors
This paper deals with Gross Error Detection using a signal-based approach and proposes an algorithm to be applied in industrial processes. The developed algorithm is used in some industrial software platforms to detect sensor outliers. A validation of this algorithm through computer simulations is shown. Results using real sensor measurements from industrial processes are reported at the end of the paper.
| Original language | English |
|---|---|
| Journal | IFAC-PapersOnLine |
| Volume | 48 |
| Issue number | 4 |
| Pages (from-to) | 37-42 |
| Number of pages | 6 |
| ISSN | 2405-8971 |
| DOIs | |
| Publication status | Published - 01.06.2015 |
| Event | 13th IFAC and IEEE Conference on Programmable Devices and Embedded Systems - PDES 2015 - Silesian University of Technology, Krakau, Poland Duration: 13.05.2015 → 15.05.2015 Conference number: 13 http://pdes.polsl.pl/ https://www.ifac-control.org/events/programmable-devices-and-embedded-systems-13th-pdes-2015 |
- Engineering - Algorithms, Embedded systems, Process control, Gross error detection, Haar wavelets, Industrial processs, Industrial software, Sensor measurements, Technical process
Research areas
- Control and Systems Engineering