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Elemental analysis using electron beam‐induced K X‐rays

Research output: Journal contributions › Journal articles › Research › peer-review

Standard

Elemental analysis using electron beam‐induced K X‐rays. / Pape, Arthur J..; Sens, J. C.; Georgiadis, A.
In: X‐Ray Spectrometry, Vol. 16, No. 5, 01.09.1987, p. 207-209.

Research output: Journal contributions › Journal articles › Research › peer-review

Harvard

Pape, AJ, Sens, JC & Georgiadis, A 1987, 'Elemental analysis using electron beam‐induced K X‐rays', X‐Ray Spectrometry, vol. 16, no. 5, pp. 207-209. https://doi.org/10.1002/xrs.1300160505

APA

Pape, A. J., Sens, J. C., & Georgiadis, A. (1987). Elemental analysis using electron beam‐induced K X‐rays. X‐Ray Spectrometry, 16(5), 207-209. https://doi.org/10.1002/xrs.1300160505

Vancouver

Pape AJ, Sens JC, Georgiadis A. Elemental analysis using electron beam‐induced K X‐rays. X‐Ray Spectrometry. 1987 Sept 1;16(5):207-209. doi: 10.1002/xrs.1300160505

Bibtex

@article{9b6955f22d694dc7aa1e9c3e26a5f338,
title = "Elemental analysis using electron beam‐induced K X‐rays",
abstract = "Representative production cross‐sections for bremsstrahlung, which constitutes an unavoidable spectral background in an X‐ray analysis using electron beam excitation, have been calculated as a function of target and angle for incident electrons in the energy range 0.2—10 MeV. These values, used in conjunction with the corresponding K X‐ray production cross‐sections and non‐fundamental experimental variables particular to each laboratory (detector resolution and ambient background), determine the feasibility of a K X‐ray analysis by direct electron beam excitation, and permit the evaluation of an ideal detection limit. Copyright {\textcopyright} 1987 John Wiley & Sons, Ltd.",
keywords = "Engineering",
author = "Pape, {Arthur J..} and Sens, {J. C.} and A. Georgiadis",
year = "1987",
month = sep,
day = "1",
doi = "10.1002/xrs.1300160505",
language = "English",
volume = "16",
pages = "207--209",
journal = "X‐Ray Spectrometry",
issn = "0049-8246",
publisher = "John Wiley & Sons Ltd.",
number = "5",

}

RIS

TY - JOUR

T1 - Elemental analysis using electron beam‐induced K X‐rays

AU - Pape, Arthur J..

AU - Sens, J. C.

AU - Georgiadis, A.

PY - 1987/9/1

Y1 - 1987/9/1

N2 - Representative production cross‐sections for bremsstrahlung, which constitutes an unavoidable spectral background in an X‐ray analysis using electron beam excitation, have been calculated as a function of target and angle for incident electrons in the energy range 0.2—10 MeV. These values, used in conjunction with the corresponding K X‐ray production cross‐sections and non‐fundamental experimental variables particular to each laboratory (detector resolution and ambient background), determine the feasibility of a K X‐ray analysis by direct electron beam excitation, and permit the evaluation of an ideal detection limit. Copyright © 1987 John Wiley & Sons, Ltd.

AB - Representative production cross‐sections for bremsstrahlung, which constitutes an unavoidable spectral background in an X‐ray analysis using electron beam excitation, have been calculated as a function of target and angle for incident electrons in the energy range 0.2—10 MeV. These values, used in conjunction with the corresponding K X‐ray production cross‐sections and non‐fundamental experimental variables particular to each laboratory (detector resolution and ambient background), determine the feasibility of a K X‐ray analysis by direct electron beam excitation, and permit the evaluation of an ideal detection limit. Copyright © 1987 John Wiley & Sons, Ltd.

KW - Engineering

UR - http://www.scopus.com/inward/record.url?scp=84981788687&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/7c0ecc70-39dc-3997-995c-6dfeaa8b23a8/

U2 - 10.1002/xrs.1300160505

DO - 10.1002/xrs.1300160505

M3 - Journal articles

AN - SCOPUS:84981788687

VL - 16

SP - 207

EP - 209

JO - X‐Ray Spectrometry

JF - X‐Ray Spectrometry

SN - 0049-8246

IS - 5

ER -

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Research output: Journal contributions › Journal articles › Research › peer-review

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