TY - JOUR

T1 - Elemental analysis using electron beam‐induced K X‐rays

AU - Pape, Arthur J..

AU - Sens, J. C.

AU - Georgiadis, A.

PY - 1987/9/1

Y1 - 1987/9/1

N2 - Representative production cross‐sections for bremsstrahlung, which constitutes an unavoidable spectral background in an X‐ray analysis using electron beam excitation, have been calculated as a function of target and angle for incident electrons in the energy range 0.2—10 MeV. These values, used in conjunction with the corresponding K X‐ray production cross‐sections and non‐fundamental experimental variables particular to each laboratory (detector resolution and ambient background), determine the feasibility of a K X‐ray analysis by direct electron beam excitation, and permit the evaluation of an ideal detection limit. Copyright © 1987 John Wiley & Sons, Ltd.

AB - Representative production cross‐sections for bremsstrahlung, which constitutes an unavoidable spectral background in an X‐ray analysis using electron beam excitation, have been calculated as a function of target and angle for incident electrons in the energy range 0.2—10 MeV. These values, used in conjunction with the corresponding K X‐ray production cross‐sections and non‐fundamental experimental variables particular to each laboratory (detector resolution and ambient background), determine the feasibility of a K X‐ray analysis by direct electron beam excitation, and permit the evaluation of an ideal detection limit. Copyright © 1987 John Wiley & Sons, Ltd.

KW - Engineering

UR - http://www.scopus.com/inward/record.url?scp=84981788687&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/7c0ecc70-39dc-3997-995c-6dfeaa8b23a8/

U2 - 10.1002/xrs.1300160505

DO - 10.1002/xrs.1300160505

M3 - Journal articles

AN - SCOPUS:84981788687

VL - 16

SP - 207

EP - 209

JO - X‐Ray Spectrometry

JF - X‐Ray Spectrometry

SN - 0049-8246

IS - 5

ER -