Elemental analysis using electron beam‐induced K X‐rays
Research output: Journal contributions › Journal articles › Research › peer-review
Authors
Representative production cross‐sections for bremsstrahlung, which constitutes an unavoidable spectral background in an X‐ray analysis using electron beam excitation, have been calculated as a function of target and angle for incident electrons in the energy range 0.2—10 MeV. These values, used in conjunction with the corresponding K X‐ray production cross‐sections and non‐fundamental experimental variables particular to each laboratory (detector resolution and ambient background), determine the feasibility of a K X‐ray analysis by direct electron beam excitation, and permit the evaluation of an ideal detection limit. Copyright © 1987 John Wiley & Sons, Ltd.
Original language | English |
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Journal | X‐Ray Spectrometry |
Volume | 16 |
Issue number | 5 |
Pages (from-to) | 207-209 |
Number of pages | 3 |
ISSN | 0049-8246 |
DOIs | |
Publication status | Published - 01.09.1987 |
Externally published | Yes |
- Engineering