Elemental analysis using electron beam‐induced K X‐rays

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Representative production cross‐sections for bremsstrahlung, which constitutes an unavoidable spectral background in an X‐ray analysis using electron beam excitation, have been calculated as a function of target and angle for incident electrons in the energy range 0.2—10 MeV. These values, used in conjunction with the corresponding K X‐ray production cross‐sections and non‐fundamental experimental variables particular to each laboratory (detector resolution and ambient background), determine the feasibility of a K X‐ray analysis by direct electron beam excitation, and permit the evaluation of an ideal detection limit. Copyright © 1987 John Wiley & Sons, Ltd.
Original languageEnglish
JournalX‐Ray Spectrometry
Volume16
Issue number5
Pages (from-to)207-209
Number of pages3
ISSN0049-8246
DOIs
Publication statusPublished - 01.09.1987
Externally publishedYes

DOI

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