Investigation and modeling of the material behavior due to evolving dislocation microstructures in fcc and bcc metals

Till Clausmeyer; Benjamin Klusemann; Swantje Bargmann; Bob Svendsen

Investigation and modeling of the material behavior due to evolving dislocation microstructures in fcc and bcc metals

Publikation: Beiträge in Sammelwerken › Aufsätze in Konferenzbänden › Forschung

Standard

Investigation and modeling of the material behavior due to evolving dislocation microstructures in fcc and bcc metals. / Clausmeyer, Till; Klusemann, Benjamin; Bargmann, Swantje et al.
Proceedings of the Fifth International Conference Multiscale Materials Modeling MMM2010: Conference Proceedings. Hrsg. / Peter Gumbsch; Erik van der Giessen. Fraunhofer Verlag, 2010. S. 384 – 387.

Publikation: Beiträge in Sammelwerken › Aufsätze in Konferenzbänden › Forschung

Harvard

Clausmeyer, T, Klusemann, B, Bargmann, S & Svendsen, B 2010, Investigation and modeling of the material behavior due to evolving dislocation microstructures in fcc and bcc metals. in P Gumbsch & E van der Giessen (Hrsg.), Proceedings of the Fifth International Conference Multiscale Materials Modeling MMM2010: Conference Proceedings. Fraunhofer Verlag, S. 384 – 387, 5th International Conference on Multiscale Materials Modelling - MMM 2010, Freiburg, Deutschland, 04.10.10.

APA

Clausmeyer, T., Klusemann, B., Bargmann, S., & Svendsen, B. (2010). Investigation and modeling of the material behavior due to evolving dislocation microstructures in fcc and bcc metals. In P. Gumbsch, & E. van der Giessen (Hrsg.), Proceedings of the Fifth International Conference Multiscale Materials Modeling MMM2010: Conference Proceedings (S. 384 – 387). Fraunhofer Verlag.

Vancouver

Clausmeyer T, Klusemann B, Bargmann S, Svendsen B. Investigation and modeling of the material behavior due to evolving dislocation microstructures in fcc and bcc metals. in Gumbsch P, van der Giessen E, Hrsg., Proceedings of the Fifth International Conference Multiscale Materials Modeling MMM2010: Conference Proceedings. Fraunhofer Verlag. 2010. S. 384 – 387

Bibtex

@inbook{e389c713a08d45dcbc4bf95327c7c2a4,

title = "Investigation and modeling of the material behavior due to evolving dislocation microstructures in fcc and bcc metals",

keywords = "Engineering",

author = "Till Clausmeyer and Benjamin Klusemann and Swantje Bargmann and Bob Svendsen",

year = "2010",

language = "English",

isbn = "978-3-8396-0166-2 ",

pages = "384 – 387",

editor = "Peter Gumbsch and {van der Giessen}, Erik",

booktitle = "Proceedings of the Fifth International Conference Multiscale Materials Modeling MMM2010",

publisher = "Fraunhofer Verlag",

note = "5th International Conference on Multiscale Materials Modelling - MMM 2010, MMM 2010 ; Conference date: 04-10-2010 Through 08-10-2010",

url = "https://www.worldcat.org/title/proceedings-of-the-fifth-international-conference-multiscale-materials-modeling-mmm2010-october-4-8-2010-freiburg-germany/oclc/775080644&referer=brief_results",

}

RIS

TY - CHAP

T1 - Investigation and modeling of the material behavior due to evolving dislocation microstructures in fcc and bcc metals

AU - Clausmeyer, Till

AU - Klusemann, Benjamin

AU - Bargmann, Swantje

AU - Svendsen, Bob

N1 - Conference code: 5

PY - 2010

Y1 - 2010

KW - Engineering

M3 - Article in conference proceedings

SN - 978-3-8396-0166-2

SP - 384

EP - 387

BT - Proceedings of the Fifth International Conference Multiscale Materials Modeling MMM2010

A2 - Gumbsch, Peter

A2 - van der Giessen, Erik

PB - Fraunhofer Verlag

T2 - 5th International Conference on Multiscale Materials Modelling - MMM 2010

Y2 - 4 October 2010 through 8 October 2010

ER -

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