Investigation and modeling of the material behavior due to evolving dislocation microstructures in fcc and bcc metals
Publikation: Beiträge in Sammelwerken › Aufsätze in Konferenzbänden › Forschung
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Investigation and modeling of the material behavior due to evolving dislocation microstructures in fcc and bcc metals. / Clausmeyer, Till; Klusemann, Benjamin; Bargmann, Swantje et al.
Proceedings of the Fifth International Conference Multiscale Materials Modeling MMM2010: Conference Proceedings. Hrsg. / Peter Gumbsch; Erik van der Giessen. Fraunhofer Verlag, 2010. S. 384 – 387.Publikation: Beiträge in Sammelwerken › Aufsätze in Konferenzbänden › Forschung
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TY - CHAP
T1 - Investigation and modeling of the material behavior due to evolving dislocation microstructures in fcc and bcc metals
AU - Clausmeyer, Till
AU - Klusemann, Benjamin
AU - Bargmann, Swantje
AU - Svendsen, Bob
N1 - Conference code: 5
PY - 2010
Y1 - 2010
KW - Engineering
M3 - Article in conference proceedings
SN - 978-3-8396-0166-2
SP - 384
EP - 387
BT - Proceedings of the Fifth International Conference Multiscale Materials Modeling MMM2010
A2 - Gumbsch, Peter
A2 - van der Giessen, Erik
PB - Fraunhofer Verlag
T2 - 5th International Conference on Multiscale Materials Modelling - MMM 2010
Y2 - 4 October 2010 through 8 October 2010
ER -