Quality in Teacher Education and Professional Development: Chinese and German Perspectives

Publikation: Bücher und AnthologienBuch

Authors

  • John Chi-Kin Lee (Herausgeber*in)
  • Timo Ehmke (Herausgeber*in)

This book addresses the past and changing contexts of Chinese and German teacher education under the impact of globalization and echoes “quality” issues of teacher education. This edited book provides a comprehensive discussion on other issues in the management and implementation of change in teacher education related to teacher education curricula for professional development of teachers. A combination of chapters provides an overview, a review of literature and research as well as offering examples of teacher education practice and updated empirical research on these topics co-edited by two senior scholars and written by experts from Mainland China (including Hong Kong) and Germany. The volume addresses key issues on teacher standards, ICT in education and e-learning in teacher education, STEM education, vocational teacher education, university-school partnership in teacher education and teaching Chinese or German as a second language. This is an up-to-date academic book to look at profound issues related to quality in teacher education and teachers’ professional development in mainland China and Germany. It will be a useful reference for graduate students and researchers in the field of international and comparative education, teacher education and curriculum studies, teacher educators and practitioners to learn from trends, best practice and challenges that have been encountered in Mainland China and Germany.

Titel in ÜbersetzungQualität in der Lehrkräftebildung und -weiterbildung
OriginalspracheEnglisch
ErscheinungsortOxon
VerlagRoutledge Taylor & Francis Group
Auflage1
Anzahl der Seiten278
ISBN (Print)9780367469375, 978-1-032-05530-5
ISBN (elektronisch)978-1-003-19797-3, 978-100045414-7
DOIs
PublikationsstatusErschienen - 28.09.2021

Bibliographische Notiz

Publisher Copyright:
© 2022 selection and editorial matter, John Chi-Kin Lee and Timo Ehmke; individual chapters, the contributors.

DOI