An on-line orthogonal wavelet denoising algorithm for high-resolution surface scans

Publikation: Beiträge in ZeitschriftenZeitschriftenaufsätzeForschungbegutachtet

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An on-line orthogonal wavelet denoising algorithm for high-resolution surface scans. / Schimmack, Manuel; Mercorelli, Paolo.
in: Journal of the Franklin Institute, Jahrgang 355, Nr. 18, 12.2018, S. 9245-9270 .

Publikation: Beiträge in ZeitschriftenZeitschriftenaufsätzeForschungbegutachtet

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@article{2c7cb91cf9474780a41dd739e567b3ab,
title = "An on-line orthogonal wavelet denoising algorithm for high-resolution surface scans",
abstract = "This paper deals with noise detection and threshold free on-line denoising procedure for discrete scanning probe microscopy (SPM) surface images using wavelets. In this sense, the proposed denoising procedure works without thresholds for the localisation of noise, as well for the stop criterium of the algorithm. In particular, a proposition which states a constructive structural property of the wavelets tree with respect to a defined seminorm has been proven for a special technical case. Using orthogonal wavelets, it is possible to obtain an efficient localisation of noise and as a consequence a denoising of the measured signal. An on-line denoising algorithm, which is based upon the discrete wavelet transform (DWT), is proposed to detect unavoidable measured noise in the acquired data. With the help of a seminorm the noise of a signal is defined as an incoherent part of a measured signal and it is possible to rearrange the wavelet basis which can illuminate the differences between its coherent and incoherent part. In effect, the procedure looks for the subspaces consisting of wavelet packets characterised either by small or opposing components in the wavelet domain. Taking real measurements the effectiveness of the proposed denoising algorithm is validated and compared with Gaussian FIR- and Median filter. The proposed method was built using the free wavelet toolboxes from the WaveLab 850 library of the Stanford University (USA).",
keywords = "Engineering",
author = "Manuel Schimmack and Paolo Mercorelli",
year = "2018",
month = dec,
doi = "10.1016/j.jfranklin.2017.05.042",
language = "English",
volume = "355",
pages = "9245--9270 ",
journal = "Journal of the Franklin Institute",
issn = "0016-0032",
publisher = "Elsevier Ltd",
number = "18",

}

RIS

TY - JOUR

T1 - An on-line orthogonal wavelet denoising algorithm for high-resolution surface scans

AU - Schimmack, Manuel

AU - Mercorelli, Paolo

PY - 2018/12

Y1 - 2018/12

N2 - This paper deals with noise detection and threshold free on-line denoising procedure for discrete scanning probe microscopy (SPM) surface images using wavelets. In this sense, the proposed denoising procedure works without thresholds for the localisation of noise, as well for the stop criterium of the algorithm. In particular, a proposition which states a constructive structural property of the wavelets tree with respect to a defined seminorm has been proven for a special technical case. Using orthogonal wavelets, it is possible to obtain an efficient localisation of noise and as a consequence a denoising of the measured signal. An on-line denoising algorithm, which is based upon the discrete wavelet transform (DWT), is proposed to detect unavoidable measured noise in the acquired data. With the help of a seminorm the noise of a signal is defined as an incoherent part of a measured signal and it is possible to rearrange the wavelet basis which can illuminate the differences between its coherent and incoherent part. In effect, the procedure looks for the subspaces consisting of wavelet packets characterised either by small or opposing components in the wavelet domain. Taking real measurements the effectiveness of the proposed denoising algorithm is validated and compared with Gaussian FIR- and Median filter. The proposed method was built using the free wavelet toolboxes from the WaveLab 850 library of the Stanford University (USA).

AB - This paper deals with noise detection and threshold free on-line denoising procedure for discrete scanning probe microscopy (SPM) surface images using wavelets. In this sense, the proposed denoising procedure works without thresholds for the localisation of noise, as well for the stop criterium of the algorithm. In particular, a proposition which states a constructive structural property of the wavelets tree with respect to a defined seminorm has been proven for a special technical case. Using orthogonal wavelets, it is possible to obtain an efficient localisation of noise and as a consequence a denoising of the measured signal. An on-line denoising algorithm, which is based upon the discrete wavelet transform (DWT), is proposed to detect unavoidable measured noise in the acquired data. With the help of a seminorm the noise of a signal is defined as an incoherent part of a measured signal and it is possible to rearrange the wavelet basis which can illuminate the differences between its coherent and incoherent part. In effect, the procedure looks for the subspaces consisting of wavelet packets characterised either by small or opposing components in the wavelet domain. Taking real measurements the effectiveness of the proposed denoising algorithm is validated and compared with Gaussian FIR- and Median filter. The proposed method was built using the free wavelet toolboxes from the WaveLab 850 library of the Stanford University (USA).

KW - Engineering

UR - http://www.scopus.com/inward/record.url?scp=85026630450&partnerID=8YFLogxK

U2 - 10.1016/j.jfranklin.2017.05.042

DO - 10.1016/j.jfranklin.2017.05.042

M3 - Journal articles

AN - SCOPUS:85026630450

VL - 355

SP - 9245

EP - 9270

JO - Journal of the Franklin Institute

JF - Journal of the Franklin Institute

SN - 0016-0032

IS - 18

ER -

DOI

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