Standard
Accuracy Improvement by Artificial Neural Networks in Technical Vision System. / Trujillo-Hernández, Gabriel ; Rodríguez-Quiñonez, Julio C. ; Ramírez-Hernández, Luis R. et al.
IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society. Piscataway: IEEE - Institute of Electrical and Electronics Engineers Inc., 2019. S. 5572-5577 8927596 (IECON Proceedings (Industrial Electronics Conference); Band 2019-October).
Publikation: Beiträge in Sammelwerken › Aufsätze in Konferenzbänden › Forschung › begutachtet
Harvard
Trujillo-Hernández, G, Rodríguez-Quiñonez, JC, Ramírez-Hernández, LR, Castro-Toscano, MJ, Hernández-Balbuena, D, Flores-Fuentes, W, Sergiyenko, O, Lindner, L
& Mercorelli, P 2019,
Accuracy Improvement by Artificial Neural Networks in Technical Vision System. in
IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society., 8927596, IECON Proceedings (Industrial Electronics Conference), Bd. 2019-October, IEEE - Institute of Electrical and Electronics Engineers Inc., Piscataway, S. 5572-5577, 45th Annual Conference of the Institute of Electrical and Electronics Engineers' Industrial Electronics Society - 2019, Lisbon, Portugal,
14.10.19.
https://doi.org/10.1109/IECON.2019.8927596APA
Trujillo-Hernández, G., Rodríguez-Quiñonez, J. C., Ramírez-Hernández, L. R., Castro-Toscano, M. J., Hernández-Balbuena, D., Flores-Fuentes, W., Sergiyenko, O., Lindner, L.
, & Mercorelli, P. (2019).
Accuracy Improvement by Artificial Neural Networks in Technical Vision System. In
IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (S. 5572-5577). Artikel 8927596 (IECON Proceedings (Industrial Electronics Conference); Band 2019-October). IEEE - Institute of Electrical and Electronics Engineers Inc..
https://doi.org/10.1109/IECON.2019.8927596Vancouver
Trujillo-Hernández G, Rodríguez-Quiñonez JC, Ramírez-Hernández LR, Castro-Toscano MJ, Hernández-Balbuena D, Flores-Fuentes W et al.
Accuracy Improvement by Artificial Neural Networks in Technical Vision System. in IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society. Piscataway: IEEE - Institute of Electrical and Electronics Engineers Inc. 2019. S. 5572-5577. 8927596. (IECON Proceedings (Industrial Electronics Conference)). doi: 10.1109/IECON.2019.8927596
Bibtex
@inbook{d4e95ff95fdc49a99312f89835310c6c,
title = "Accuracy Improvement by Artificial Neural Networks in Technical Vision System",
abstract = "This paper proposes an Artificial Neural Network (ANN) to accurately predict the real angles obtained by a Triangulation Vision System. The performance of the ANN is compared with the K-Nearest Neighbors algorithm from previous publications. For the experimentation it was necessary to create a database to train and prove both methods in different coordinates on a determinate area through the dynamic triangulation method. Afterwards, the root mean square error is calculated to obtain the accuracy of each algorithm. Finally, several laser scanning measurements were taken at different distances to analyze the measurement dispersion of both algorithms.",
keywords = "Engineering, Artificial Neural Networks, dynamic triangulation, K-Nearest Neighbors, laser scanning",
author = "Gabriel Trujillo-Hern{\'a}ndez and Rodr{\'i}guez-Qui{\~n}onez, {Julio C.} and Ram{\'i}rez-Hern{\'a}ndez, {Luis R.} and Castro-Toscano, {Moises J.} and Daniel Hern{\'a}ndez-Balbuena and Wendy Flores-Fuentes and Oleg Sergiyenko and Lars Lindner and Paolo Mercorelli",
year = "2019",
month = oct,
doi = "10.1109/IECON.2019.8927596",
language = "English",
isbn = "978-1-7281-4879-3",
series = "IECON Proceedings (Industrial Electronics Conference)",
publisher = "IEEE - Institute of Electrical and Electronics Engineers Inc.",
pages = "5572--5577",
booktitle = "IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society",
address = "United States",
note = "45th Annual Conference of the Institute of Electrical and Electronics Engineers' Industrial Electronics Society - 2019, IECON'2019 ; Conference date: 14-10-2019 Through 17-10-2019",
url = "https://iecon2019.org/",
}
RIS
TY - CHAP
T1 - Accuracy Improvement by Artificial Neural Networks in Technical Vision System
AU - Trujillo-Hernández, Gabriel
AU - Rodríguez-Quiñonez, Julio C.
AU - Ramírez-Hernández, Luis R.
AU - Castro-Toscano, Moises J.
AU - Hernández-Balbuena, Daniel
AU - Flores-Fuentes, Wendy
AU - Sergiyenko, Oleg
AU - Lindner, Lars
AU - Mercorelli, Paolo
N1 - Conference code: 45
PY - 2019/10
Y1 - 2019/10
N2 - This paper proposes an Artificial Neural Network (ANN) to accurately predict the real angles obtained by a Triangulation Vision System. The performance of the ANN is compared with the K-Nearest Neighbors algorithm from previous publications. For the experimentation it was necessary to create a database to train and prove both methods in different coordinates on a determinate area through the dynamic triangulation method. Afterwards, the root mean square error is calculated to obtain the accuracy of each algorithm. Finally, several laser scanning measurements were taken at different distances to analyze the measurement dispersion of both algorithms.
AB - This paper proposes an Artificial Neural Network (ANN) to accurately predict the real angles obtained by a Triangulation Vision System. The performance of the ANN is compared with the K-Nearest Neighbors algorithm from previous publications. For the experimentation it was necessary to create a database to train and prove both methods in different coordinates on a determinate area through the dynamic triangulation method. Afterwards, the root mean square error is calculated to obtain the accuracy of each algorithm. Finally, several laser scanning measurements were taken at different distances to analyze the measurement dispersion of both algorithms.
KW - Engineering
KW - Artificial Neural Networks
KW - dynamic triangulation
KW - K-Nearest Neighbors
KW - laser scanning
UR - http://www.scopus.com/inward/record.url?scp=85084152397&partnerID=8YFLogxK
U2 - 10.1109/IECON.2019.8927596
DO - 10.1109/IECON.2019.8927596
M3 - Article in conference proceedings
SN - 978-1-7281-4879-3
T3 - IECON Proceedings (Industrial Electronics Conference)
SP - 5572
EP - 5577
BT - IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society
PB - IEEE - Institute of Electrical and Electronics Engineers Inc.
CY - Piscataway
T2 - 45th Annual Conference of the Institute of Electrical and Electronics Engineers' Industrial Electronics Society - 2019
Y2 - 14 October 2019 through 17 October 2019
ER -
