Accuracy Improvement by Artificial Neural Networks in Technical Vision System

Research output: Contributions to collected editions/worksArticle in conference proceedingsResearchpeer-review

Standard

Accuracy Improvement by Artificial Neural Networks in Technical Vision System. / Trujillo-Hernández, Gabriel ; Rodríguez-Quiñonez, Julio C. ; Ramírez-Hernández, Luis R. et al.
IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society. Piscataway: IEEE - Institute of Electrical and Electronics Engineers Inc., 2019. p. 5572-5577 8927596 (IECON Proceedings (Industrial Electronics Conference); Vol. 2019-October).

Research output: Contributions to collected editions/worksArticle in conference proceedingsResearchpeer-review

Harvard

Trujillo-Hernández, G, Rodríguez-Quiñonez, JC, Ramírez-Hernández, LR, Castro-Toscano, MJ, Hernández-Balbuena, D, Flores-Fuentes, W, Sergiyenko, O, Lindner, L & Mercorelli, P 2019, Accuracy Improvement by Artificial Neural Networks in Technical Vision System. in IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society., 8927596, IECON Proceedings (Industrial Electronics Conference), vol. 2019-October, IEEE - Institute of Electrical and Electronics Engineers Inc., Piscataway, pp. 5572-5577, 45th Annual Conference of the Institute of Electrical and Electronics Engineers' Industrial Electronics Society - 2019, Lisbon, Portugal, 14.10.19. https://doi.org/10.1109/IECON.2019.8927596

APA

Trujillo-Hernández, G., Rodríguez-Quiñonez, J. C., Ramírez-Hernández, L. R., Castro-Toscano, M. J., Hernández-Balbuena, D., Flores-Fuentes, W., Sergiyenko, O., Lindner, L., & Mercorelli, P. (2019). Accuracy Improvement by Artificial Neural Networks in Technical Vision System. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (pp. 5572-5577). Article 8927596 (IECON Proceedings (Industrial Electronics Conference); Vol. 2019-October). IEEE - Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IECON.2019.8927596

Vancouver

Trujillo-Hernández G, Rodríguez-Quiñonez JC, Ramírez-Hernández LR, Castro-Toscano MJ, Hernández-Balbuena D, Flores-Fuentes W et al. Accuracy Improvement by Artificial Neural Networks in Technical Vision System. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society. Piscataway: IEEE - Institute of Electrical and Electronics Engineers Inc. 2019. p. 5572-5577. 8927596. (IECON Proceedings (Industrial Electronics Conference)). doi: 10.1109/IECON.2019.8927596

Bibtex

@inbook{d4e95ff95fdc49a99312f89835310c6c,
title = "Accuracy Improvement by Artificial Neural Networks in Technical Vision System",
abstract = "This paper proposes an Artificial Neural Network (ANN) to accurately predict the real angles obtained by a Triangulation Vision System. The performance of the ANN is compared with the K-Nearest Neighbors algorithm from previous publications. For the experimentation it was necessary to create a database to train and prove both methods in different coordinates on a determinate area through the dynamic triangulation method. Afterwards, the root mean square error is calculated to obtain the accuracy of each algorithm. Finally, several laser scanning measurements were taken at different distances to analyze the measurement dispersion of both algorithms.",
keywords = "Engineering, Artificial Neural Networks, dynamic triangulation, K-Nearest Neighbors, laser scanning",
author = "Gabriel Trujillo-Hern{\'a}ndez and Rodr{\'i}guez-Qui{\~n}onez, {Julio C.} and Ram{\'i}rez-Hern{\'a}ndez, {Luis R.} and Castro-Toscano, {Moises J.} and Daniel Hern{\'a}ndez-Balbuena and Wendy Flores-Fuentes and Oleg Sergiyenko and Lars Lindner and Paolo Mercorelli",
year = "2019",
month = oct,
doi = "10.1109/IECON.2019.8927596",
language = "English",
isbn = "978-1-7281-4879-3",
series = "IECON Proceedings (Industrial Electronics Conference)",
publisher = "IEEE - Institute of Electrical and Electronics Engineers Inc.",
pages = "5572--5577",
booktitle = "IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society",
address = "United States",
note = "45th Annual Conference of the Institute of Electrical and Electronics Engineers' Industrial Electronics Society - 2019, IECON'2019 ; Conference date: 14-10-2019 Through 17-10-2019",
url = "https://iecon2019.org/",

}

RIS

TY - CHAP

T1 - Accuracy Improvement by Artificial Neural Networks in Technical Vision System

AU - Trujillo-Hernández, Gabriel

AU - Rodríguez-Quiñonez, Julio C.

AU - Ramírez-Hernández, Luis R.

AU - Castro-Toscano, Moises J.

AU - Hernández-Balbuena, Daniel

AU - Flores-Fuentes, Wendy

AU - Sergiyenko, Oleg

AU - Lindner, Lars

AU - Mercorelli, Paolo

N1 - Conference code: 45

PY - 2019/10

Y1 - 2019/10

N2 - This paper proposes an Artificial Neural Network (ANN) to accurately predict the real angles obtained by a Triangulation Vision System. The performance of the ANN is compared with the K-Nearest Neighbors algorithm from previous publications. For the experimentation it was necessary to create a database to train and prove both methods in different coordinates on a determinate area through the dynamic triangulation method. Afterwards, the root mean square error is calculated to obtain the accuracy of each algorithm. Finally, several laser scanning measurements were taken at different distances to analyze the measurement dispersion of both algorithms.

AB - This paper proposes an Artificial Neural Network (ANN) to accurately predict the real angles obtained by a Triangulation Vision System. The performance of the ANN is compared with the K-Nearest Neighbors algorithm from previous publications. For the experimentation it was necessary to create a database to train and prove both methods in different coordinates on a determinate area through the dynamic triangulation method. Afterwards, the root mean square error is calculated to obtain the accuracy of each algorithm. Finally, several laser scanning measurements were taken at different distances to analyze the measurement dispersion of both algorithms.

KW - Engineering

KW - Artificial Neural Networks

KW - dynamic triangulation

KW - K-Nearest Neighbors

KW - laser scanning

UR - http://www.scopus.com/inward/record.url?scp=85084152397&partnerID=8YFLogxK

U2 - 10.1109/IECON.2019.8927596

DO - 10.1109/IECON.2019.8927596

M3 - Article in conference proceedings

SN - 978-1-7281-4879-3

T3 - IECON Proceedings (Industrial Electronics Conference)

SP - 5572

EP - 5577

BT - IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society

PB - IEEE - Institute of Electrical and Electronics Engineers Inc.

CY - Piscataway

T2 - 45th Annual Conference of the Institute of Electrical and Electronics Engineers' Industrial Electronics Society - 2019

Y2 - 14 October 2019 through 17 October 2019

ER -

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