Three-Dimensional Measurement Through the Calibration of a Laser Profilometer
Research output: Contributions to collected editions/works › Article in conference proceedings › Research › peer-review
Authors
Profilometry systems have been used with light beam in-point, in-line, and point patterns to obtain measurements in different dimensions. Profilometry systems are adaptable, serving both industrial and laboratory applications for diverse objectives. In this paper, a laser profilometer system is presented with different light beam configurations to perform three-dimensional calculations, including a point pattern setup that enables spatial measurements from the camera's viewpoint. In the experimental phase, changes in configuration confirmed that the system can take three-dimensional measurements using a camera, laser, and a specific equation. The results and analyses are presented in detail.
Original language | English |
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Title of host publication | 2025 IEEE 34th International Symposium on Industrial Electronics, ISIE 2025 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Publication date | 2025 |
ISBN (print) | 979-8-3503-7480-3 |
ISBN (electronic) | 979-8-3503-7479-7 |
DOIs | |
Publication status | Published - 2025 |
Event | 34th IEEE International Symposium on Industrial Electronics, ISIE 2025 - Toronto, Canada Duration: 20.06.2025 → 23.06.2025 |
Bibliographical note
Publisher Copyright:
© 2025 IEEE.
- Control and Systems Engineering
- Electrical and Electronic Engineering
ASJC Scopus Subject Areas
- Beam Reflectance, HSV, Laser Beam, Measurement 3D, Profilometer
- Engineering
- Mathematics