Three-Dimensional Measurement Through the Calibration of a Laser Profilometer

Research output: Contributions to collected editions/worksArticle in conference proceedingsResearchpeer-review

Authors

  • Leonardo D. Medina-Madrazo
  • Moises J. Castro-Toscano
  • Julio C. Rodriguez-Quinonez
  • Wendy Flores-Fuentes
  • Daniel Hernandez-Balbuena
  • Oscar Real-Moreno
  • Oleg Sergiyenko
  • Paolo Mercorelli

Profilometry systems have been used with light beam in-point, in-line, and point patterns to obtain measurements in different dimensions. Profilometry systems are adaptable, serving both industrial and laboratory applications for diverse objectives. In this paper, a laser profilometer system is presented with different light beam configurations to perform three-dimensional calculations, including a point pattern setup that enables spatial measurements from the camera's viewpoint. In the experimental phase, changes in configuration confirmed that the system can take three-dimensional measurements using a camera, laser, and a specific equation. The results and analyses are presented in detail.

Original languageEnglish
Title of host publication2025 IEEE 34th International Symposium on Industrial Electronics, ISIE 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Publication date2025
ISBN (print)979-8-3503-7480-3
ISBN (electronic)979-8-3503-7479-7
DOIs
Publication statusPublished - 2025
Event34th IEEE International Symposium on Industrial Electronics, ISIE 2025 - Toronto, Canada
Duration: 20.06.202523.06.2025

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