Three-Dimensional Measurement Through the Calibration of a Laser Profilometer
Publikation: Beiträge in Sammelwerken › Aufsätze in Konferenzbänden › Forschung › begutachtet
Authors
Profilometry systems have been used with light beam in-point, in-line, and point patterns to obtain measurements in different dimensions. Profilometry systems are adaptable, serving both industrial and laboratory applications for diverse objectives. In this paper, a laser profilometer system is presented with different light beam configurations to perform three-dimensional calculations, including a point pattern setup that enables spatial measurements from the camera's viewpoint. In the experimental phase, changes in configuration confirmed that the system can take three-dimensional measurements using a camera, laser, and a specific equation. The results and analyses are presented in detail.
Originalsprache | Englisch |
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Titel | 2025 IEEE 34th International Symposium on Industrial Electronics, ISIE 2025 |
Verlag | Institute of Electrical and Electronics Engineers Inc. |
Erscheinungsdatum | 2025 |
ISBN (Print) | 979-8-3503-7480-3 |
ISBN (elektronisch) | 979-8-3503-7479-7 |
DOIs | |
Publikationsstatus | Erschienen - 2025 |
Veranstaltung | 34th IEEE International Symposium on Industrial Electronics, ISIE 2025 - Toronto, Kanada Dauer: 20.06.2025 → 23.06.2025 |
Bibliographische Notiz
Publisher Copyright:
© 2025 IEEE.
- Steuerungs- und Systemtechnik
- Elektrotechnik und Elektronik
ASJC Scopus Sachgebiete
- Ingenieurwissenschaften
- Mathematik