Three-Dimensional Measurement Through the Calibration of a Laser Profilometer

Publikation: Beiträge in SammelwerkenAufsätze in KonferenzbändenForschungbegutachtet

Authors

  • Leonardo D. Medina-Madrazo
  • Moises J. Castro-Toscano
  • Julio C. Rodriguez-Quinonez
  • Wendy Flores-Fuentes
  • Daniel Hernandez-Balbuena
  • Oscar Real-Moreno
  • Oleg Sergiyenko
  • Paolo Mercorelli

Profilometry systems have been used with light beam in-point, in-line, and point patterns to obtain measurements in different dimensions. Profilometry systems are adaptable, serving both industrial and laboratory applications for diverse objectives. In this paper, a laser profilometer system is presented with different light beam configurations to perform three-dimensional calculations, including a point pattern setup that enables spatial measurements from the camera's viewpoint. In the experimental phase, changes in configuration confirmed that the system can take three-dimensional measurements using a camera, laser, and a specific equation. The results and analyses are presented in detail.

OriginalspracheEnglisch
Titel2025 IEEE 34th International Symposium on Industrial Electronics (ISIE)
Anzahl der Seiten6
ErscheinungsortPiscataway
VerlagInstitute of Electrical and Electronics Engineers Inc.
Erscheinungsdatum2025
ISBN (Print)979-8-3503-7480-3
ISBN (elektronisch)979-8-3503-7479-7
DOIs
PublikationsstatusErschienen - 2025
VeranstaltungIEEE 34th International Symposium on Industrial Electronics - ISIE 2025 - Keele Campus York University , Toronto, Kanada
Dauer: 20.06.202523.06.2025
Konferenznummer: 34
https://iten.ieee-ies.org/externalrssfeed/2025/2025-isie-34th-ieee-international-symposium-on-industrial-electronics/
https://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=11124554 (Proceedings URL)
https://doi.org/10.1109/isie62713.2025 (DOI)

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