Standard
Three-Dimensional Measurement Through the Calibration of a Laser Profilometer. / Medina-Madrazo, Leonardo D.; Castro-Toscano, Moises J.; Rodriguez-Quinonez, Julio C. et al.
2025 IEEE 34th International Symposium on Industrial Electronics, ISIE 2025. Institute of Electrical and Electronics Engineers Inc., 2025. (IEEE International Symposium on Industrial Electronics).
Research output: Contributions to collected editions/works › Article in conference proceedings › Research › peer-review
Harvard
Medina-Madrazo, LD, Castro-Toscano, MJ, Rodriguez-Quinonez, JC, Flores-Fuentes, W, Hernandez-Balbuena, D, Real-Moreno, O, Sergiyenko, O
& Mercorelli, P 2025,
Three-Dimensional Measurement Through the Calibration of a Laser Profilometer. in
2025 IEEE 34th International Symposium on Industrial Electronics, ISIE 2025. IEEE International Symposium on Industrial Electronics, Institute of Electrical and Electronics Engineers Inc., 34th IEEE International Symposium on Industrial Electronics, ISIE 2025, Toronto, Canada,
20.06.25.
https://doi.org/10.1109/ISIE62713.2025.11124783APA
Medina-Madrazo, L. D., Castro-Toscano, M. J., Rodriguez-Quinonez, J. C., Flores-Fuentes, W., Hernandez-Balbuena, D., Real-Moreno, O., Sergiyenko, O.
, & Mercorelli, P. (2025).
Three-Dimensional Measurement Through the Calibration of a Laser Profilometer. In
2025 IEEE 34th International Symposium on Industrial Electronics, ISIE 2025 (IEEE International Symposium on Industrial Electronics). Institute of Electrical and Electronics Engineers Inc..
https://doi.org/10.1109/ISIE62713.2025.11124783Vancouver
Medina-Madrazo LD, Castro-Toscano MJ, Rodriguez-Quinonez JC, Flores-Fuentes W, Hernandez-Balbuena D, Real-Moreno O et al.
Three-Dimensional Measurement Through the Calibration of a Laser Profilometer. In 2025 IEEE 34th International Symposium on Industrial Electronics, ISIE 2025. Institute of Electrical and Electronics Engineers Inc. 2025. (IEEE International Symposium on Industrial Electronics). doi: 10.1109/ISIE62713.2025.11124783
Bibtex
@inbook{04b417c94ec349c68839fe787e88a16c,
title = "Three-Dimensional Measurement Through the Calibration of a Laser Profilometer",
abstract = "Profilometry systems have been used with light beam in-point, in-line, and point patterns to obtain measurements in different dimensions. Profilometry systems are adaptable, serving both industrial and laboratory applications for diverse objectives. In this paper, a laser profilometer system is presented with different light beam configurations to perform three-dimensional calculations, including a point pattern setup that enables spatial measurements from the camera's viewpoint. In the experimental phase, changes in configuration confirmed that the system can take three-dimensional measurements using a camera, laser, and a specific equation. The results and analyses are presented in detail.",
keywords = "Beam Reflectance, HSV, Laser Beam, Measurement 3D, Profilometer, Engineering, Mathematics",
author = "Medina-Madrazo, {Leonardo D.} and Castro-Toscano, {Moises J.} and Rodriguez-Quinonez, {Julio C.} and Wendy Flores-Fuentes and Daniel Hernandez-Balbuena and Oscar Real-Moreno and Oleg Sergiyenko and Paolo Mercorelli",
note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 34th IEEE International Symposium on Industrial Electronics, ISIE 2025 ; Conference date: 20-06-2025 Through 23-06-2025",
year = "2025",
doi = "10.1109/ISIE62713.2025.11124783",
language = "English",
isbn = "979-8-3503-7480-3",
series = "IEEE International Symposium on Industrial Electronics",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2025 IEEE 34th International Symposium on Industrial Electronics, ISIE 2025",
address = "United States",
}
RIS
TY - CHAP
T1 - Three-Dimensional Measurement Through the Calibration of a Laser Profilometer
AU - Medina-Madrazo, Leonardo D.
AU - Castro-Toscano, Moises J.
AU - Rodriguez-Quinonez, Julio C.
AU - Flores-Fuentes, Wendy
AU - Hernandez-Balbuena, Daniel
AU - Real-Moreno, Oscar
AU - Sergiyenko, Oleg
AU - Mercorelli, Paolo
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - Profilometry systems have been used with light beam in-point, in-line, and point patterns to obtain measurements in different dimensions. Profilometry systems are adaptable, serving both industrial and laboratory applications for diverse objectives. In this paper, a laser profilometer system is presented with different light beam configurations to perform three-dimensional calculations, including a point pattern setup that enables spatial measurements from the camera's viewpoint. In the experimental phase, changes in configuration confirmed that the system can take three-dimensional measurements using a camera, laser, and a specific equation. The results and analyses are presented in detail.
AB - Profilometry systems have been used with light beam in-point, in-line, and point patterns to obtain measurements in different dimensions. Profilometry systems are adaptable, serving both industrial and laboratory applications for diverse objectives. In this paper, a laser profilometer system is presented with different light beam configurations to perform three-dimensional calculations, including a point pattern setup that enables spatial measurements from the camera's viewpoint. In the experimental phase, changes in configuration confirmed that the system can take three-dimensional measurements using a camera, laser, and a specific equation. The results and analyses are presented in detail.
KW - Beam Reflectance
KW - HSV
KW - Laser Beam
KW - Measurement 3D
KW - Profilometer
KW - Engineering
KW - Mathematics
UR - http://www.scopus.com/inward/record.url?scp=105016155527&partnerID=8YFLogxK
U2 - 10.1109/ISIE62713.2025.11124783
DO - 10.1109/ISIE62713.2025.11124783
M3 - Article in conference proceedings
AN - SCOPUS:105016155527
SN - 979-8-3503-7480-3
T3 - IEEE International Symposium on Industrial Electronics
BT - 2025 IEEE 34th International Symposium on Industrial Electronics, ISIE 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 34th IEEE International Symposium on Industrial Electronics, ISIE 2025
Y2 - 20 June 2025 through 23 June 2025
ER -
