Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons
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Authors
Bremsstrahlung production cross sections have been calculated as a function of target and angle for electrons in the energy range 0.1-10 MeV. Used in conjunction with the corresponding K and L X-ray production cross sections and nonfundamental experimental quantities (detector resolution and ambient background), they allow determination of the theoretical detection limit using K or L X-ray emission induced by direct electron beam excitation.
| Original language | English |
|---|---|
| Journal | Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms |
| Volume | 50 |
| Issue number | 1-4 |
| Pages (from-to) | 321-327 |
| Number of pages | 7 |
| ISSN | 0168-583X |
| DOIs | |
| Publication status | Published - 03.04.1990 |
| Externally published | Yes |
| Event | European Conference on Accelerators in Applied Research and Technology - 1989 - Johann Wolfgang Goethe-Universitat , Frankfurt, Germany Duration: 05.09.1989 → 09.09.1989 Conference number: 1 |
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