Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons
Publikation: Beiträge in Zeitschriften › Konferenzaufsätze in Fachzeitschriften › Forschung › begutachtet
Authors
Bremsstrahlung production cross sections have been calculated as a function of target and angle for electrons in the energy range 0.1-10 MeV. Used in conjunction with the corresponding K and L X-ray production cross sections and nonfundamental experimental quantities (detector resolution and ambient background), they allow determination of the theoretical detection limit using K or L X-ray emission induced by direct electron beam excitation.
Originalsprache | Englisch |
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Zeitschrift | Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms |
Jahrgang | 50 |
Ausgabenummer | 1-4 |
Seiten (von - bis) | 321-327 |
Anzahl der Seiten | 7 |
ISSN | 0168-583X |
DOIs | |
Publikationsstatus | Erschienen - 03.04.1990 |
Extern publiziert | Ja |
Veranstaltung | European Conference on Accelerators in Applied Research and Technology - 1989 - Johann Wolfgang Goethe-Universitat , Frankfurt, Deutschland Dauer: 05.09.1989 → 09.09.1989 Konferenznummer: 1 |
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