Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons
Publikation: Beiträge in Zeitschriften › Konferenzaufsätze in Fachzeitschriften › Forschung › begutachtet
Authors
Bremsstrahlung production cross sections have been calculated as a function of target and angle for electrons in the energy range 0.1-10 MeV. Used in conjunction with the corresponding K and L X-ray production cross sections and nonfundamental experimental quantities (detector resolution and ambient background), they allow determination of the theoretical detection limit using K or L X-ray emission induced by direct electron beam excitation.
| Originalsprache | Englisch |
|---|---|
| Zeitschrift | Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms |
| Jahrgang | 50 |
| Ausgabenummer | 1-4 |
| Seiten (von - bis) | 321-327 |
| Anzahl der Seiten | 7 |
| ISSN | 0168-583X |
| DOIs | |
| Publikationsstatus | Erschienen - 03.04.1990 |
| Extern publiziert | Ja |
| Veranstaltung | European Conference on Accelerators in Applied Research and Technology - 1989 - Johann Wolfgang Goethe-Universitat , Frankfurt, Deutschland Dauer: 05.09.1989 → 09.09.1989 Konferenznummer: 1 |
- Ingenieurwissenschaften
Fachgebiete
- Instrumentierung
- Kern- und Hochenergiephysik
