Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons

Publikation: Beiträge in ZeitschriftenKonferenzaufsätze in FachzeitschriftenForschungbegutachtet

Authors

Bremsstrahlung production cross sections have been calculated as a function of target and angle for electrons in the energy range 0.1-10 MeV. Used in conjunction with the corresponding K and L X-ray production cross sections and nonfundamental experimental quantities (detector resolution and ambient background), they allow determination of the theoretical detection limit using K or L X-ray emission induced by direct electron beam excitation.

OriginalspracheEnglisch
ZeitschriftNuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
Jahrgang50
Ausgabenummer1-4
Seiten (von - bis)321-327
Anzahl der Seiten7
ISSN0168-583X
DOIs
PublikationsstatusErschienen - 03.04.1990
Extern publiziertJa
VeranstaltungEuropean Conference on Accelerators in Applied Research and Technology - 1989 - Johann Wolfgang Goethe-Universitat , Frankfurt, Deutschland
Dauer: 05.09.198909.09.1989
Konferenznummer: 1

DOI