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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, ‎0168-583X

Journal

1 - 1 out of 1Page size: 10
  1. 1990

  2. Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons

    Georgiadis, A. P., Apostolakis, D., Vourkas, M. & Pape, A. J., 03.04.1990, In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms . 50, 1-4, p. 321-327 7 p.

    Research output: Journal contributions › Conference article in journal › Research › peer-review