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Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons

Research output: Journal contributions › Conference article in journal › Research › peer-review

Standard

Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons. / Georgiadis, A. P.; Apostolakis, D.; Vourkas, M. et al.
In: Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms , Vol. 50, No. 1-4, 03.04.1990, p. 321-327.

Research output: Journal contributions › Conference article in journal › Research › peer-review

Harvard

Georgiadis, AP, Apostolakis, D, Vourkas, M & Pape, AJ 1990, 'Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons', Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms , vol. 50, no. 1-4, pp. 321-327. https://doi.org/10.1016/0168-583X(90)90375-5

APA

Georgiadis, A. P., Apostolakis, D., Vourkas, M., & Pape, A. J. (1990). Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons. Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms , 50(1-4), 321-327. https://doi.org/10.1016/0168-583X(90)90375-5

Vancouver

Georgiadis AP, Apostolakis D, Vourkas M, Pape AJ. Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons. Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms . 1990 Apr 3;50(1-4):321-327. doi: 10.1016/0168-583X(90)90375-5

Bibtex

@article{91298d5e7a804939bd9a672f3dc954f4,
title = "Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons",
abstract = "Bremsstrahlung production cross sections have been calculated as a function of target and angle for electrons in the energy range 0.1-10 MeV. Used in conjunction with the corresponding K and L X-ray production cross sections and nonfundamental experimental quantities (detector resolution and ambient background), they allow determination of the theoretical detection limit using K or L X-ray emission induced by direct electron beam excitation.",
keywords = "Engineering",
author = "Georgiadis, {A. P.} and D. Apostolakis and M. Vourkas and Pape, {Arthur J.}",
year = "1990",
month = apr,
day = "3",
doi = "10.1016/0168-583X(90)90375-5",
language = "English",
volume = "50",
pages = "321--327",
journal = "Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms ",
issn = "0168-583X",
publisher = "Elsevier B.V.",
number = "1-4",
note = "European Conference on Accelerators in Applied Research and Technology - 1989, ECAART ; Conference date: 05-09-1989 Through 09-09-1989",

}

RIS

TY - JOUR

T1 - Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons

AU - Georgiadis, A. P.

AU - Apostolakis, D.

AU - Vourkas, M.

AU - Pape, Arthur J.

N1 - Conference code: 1

PY - 1990/4/3

Y1 - 1990/4/3

N2 - Bremsstrahlung production cross sections have been calculated as a function of target and angle for electrons in the energy range 0.1-10 MeV. Used in conjunction with the corresponding K and L X-ray production cross sections and nonfundamental experimental quantities (detector resolution and ambient background), they allow determination of the theoretical detection limit using K or L X-ray emission induced by direct electron beam excitation.

AB - Bremsstrahlung production cross sections have been calculated as a function of target and angle for electrons in the energy range 0.1-10 MeV. Used in conjunction with the corresponding K and L X-ray production cross sections and nonfundamental experimental quantities (detector resolution and ambient background), they allow determination of the theoretical detection limit using K or L X-ray emission induced by direct electron beam excitation.

KW - Engineering

UR - http://www.scopus.com/inward/record.url?scp=45149135693&partnerID=8YFLogxK

U2 - 10.1016/0168-583X(90)90375-5

DO - 10.1016/0168-583X(90)90375-5

M3 - Conference article in journal

AN - SCOPUS:45149135693

VL - 50

SP - 321

EP - 327

JO - Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

SN - 0168-583X

IS - 1-4

T2 - European Conference on Accelerators in Applied Research and Technology - 1989

Y2 - 5 September 1989 through 9 September 1989

ER -

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Research output: Contributions to collected editions/works › Article in conference proceedings › Research › peer-review

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Research output: Journal contributions › Journal articles › Research › peer-review

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