Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 0168-583X

Fachzeitschrift: Zeitschrift

  1. 1990
  2. Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons

    Georgiadis, A. P., Apostolakis, D., Vourkas, M. & Pape, A. J., 03.04.1990, in : Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms . 50, 1-4, S. 321-327 7 S.

    Publikation: Beiträge in ZeitschriftenKonferenzaufsätze in FachzeitschriftenForschungbegutachtet