Geometric analysis of a laser scanner functioning based on dynamic triangulation

Publikation: Beiträge in SammelwerkenAufsätze in KonferenzbändenForschungbegutachtet

Standard

Geometric analysis of a laser scanner functioning based on dynamic triangulation. / Sepulveda-Valdez, Cesar; Sergiyenko, Oleg; Tyrsa, Vera et al.
2020 IEEE 29th International Symposium on Industrial Electronics (ISIE 2020): 17 - 19 June, 2020, Delft, Netherlands, Proceedings . Hrsg. / IEEE Industrial Electronics Society (IES) . Piscataway: IEEE - Institute of Electrical and Electronics Engineers Inc., 2020. S. 1398-1403 9152268 (IEEE International Symposium on Industrial Electronics (ISIE); Band 2020).

Publikation: Beiträge in SammelwerkenAufsätze in KonferenzbändenForschungbegutachtet

Harvard

Sepulveda-Valdez, C, Sergiyenko, O, Tyrsa, V, Flores-Fuentes, W, Rodriguez-Quinonez, JC, Murrienta-Rico, FN, Miranda-Vega, JE, Mercorelli, P & Kolendovska, M 2020, Geometric analysis of a laser scanner functioning based on dynamic triangulation. in IEEEIES (Hrsg.), 2020 IEEE 29th International Symposium on Industrial Electronics (ISIE 2020): 17 - 19 June, 2020, Delft, Netherlands, Proceedings ., 9152268, IEEE International Symposium on Industrial Electronics (ISIE), Bd. 2020, IEEE - Institute of Electrical and Electronics Engineers Inc., Piscataway, S. 1398-1403, 29th IEEE International Symposium on Industrial Electronics, ISIE 2020, Delft, Niederlande, 17.06.20. https://doi.org/10.1109/ISIE45063.2020.9152268

APA

Sepulveda-Valdez, C., Sergiyenko, O., Tyrsa, V., Flores-Fuentes, W., Rodriguez-Quinonez, J. C., Murrienta-Rico, F. N., Miranda-Vega, J. E., Mercorelli, P., & Kolendovska, M. (2020). Geometric analysis of a laser scanner functioning based on dynamic triangulation. In IEEE. I. E. S. (Hrsg.), 2020 IEEE 29th International Symposium on Industrial Electronics (ISIE 2020): 17 - 19 June, 2020, Delft, Netherlands, Proceedings (S. 1398-1403). Artikel 9152268 (IEEE International Symposium on Industrial Electronics (ISIE); Band 2020). IEEE - Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISIE45063.2020.9152268

Vancouver

Sepulveda-Valdez C, Sergiyenko O, Tyrsa V, Flores-Fuentes W, Rodriguez-Quinonez JC, Murrienta-Rico FN et al. Geometric analysis of a laser scanner functioning based on dynamic triangulation. in IEEEIES, Hrsg., 2020 IEEE 29th International Symposium on Industrial Electronics (ISIE 2020): 17 - 19 June, 2020, Delft, Netherlands, Proceedings . Piscataway: IEEE - Institute of Electrical and Electronics Engineers Inc. 2020. S. 1398-1403. 9152268. (IEEE International Symposium on Industrial Electronics (ISIE)). doi: 10.1109/ISIE45063.2020.9152268

Bibtex

@inbook{e1b634fe67b345a286ea522535169a0f,
title = "Geometric analysis of a laser scanner functioning based on dynamic triangulation",
abstract = "Laser-based scanners are widely used in state of the art technologies that obtain physic dimensions of the environment. Either for positioning purposes or 3D scanning of surfaces and objects, laser scanners have become very powerful tools in these areas. In terms of new and novel laser scanners, it's important to have some ways to determine statistical data that supports its reliability. Therefore the development of ways, methods, and tools that can help in this analysis becomes important.",
keywords = "Laser Scanner, Scanning plane equation, Technical Vision System, Engineering",
author = "Cesar Sepulveda-Valdez and Oleg Sergiyenko and Vera Tyrsa and Wendy Flores-Fuentes and Rodriguez-Quinonez, {Julio Cesar} and Murrienta-Rico, {Fabian Natanael} and Miranda-Vega, {Jesus Elias} and Paolo Mercorelli and Marina Kolendovska",
year = "2020",
month = jun,
day = "1",
doi = "10.1109/ISIE45063.2020.9152268",
language = "English",
isbn = "978-1-7281-5636-1",
series = "IEEE International Symposium on Industrial Electronics (ISIE)",
publisher = "IEEE - Institute of Electrical and Electronics Engineers Inc.",
pages = "1398--1403",
editor = "{IEEE Industrial Electronics Society (IES) }",
booktitle = "2020 IEEE 29th International Symposium on Industrial Electronics (ISIE 2020)",
address = "United States",
note = "29th IEEE International Symposium on Industrial Electronics, ISIE 2020, ISIE 2020 ; Conference date: 17-06-2020 Through 19-06-2020",
url = "http://isie2020.org/",

}

RIS

TY - CHAP

T1 - Geometric analysis of a laser scanner functioning based on dynamic triangulation

AU - Sepulveda-Valdez, Cesar

AU - Sergiyenko, Oleg

AU - Tyrsa, Vera

AU - Flores-Fuentes, Wendy

AU - Rodriguez-Quinonez, Julio Cesar

AU - Murrienta-Rico, Fabian Natanael

AU - Miranda-Vega, Jesus Elias

AU - Mercorelli, Paolo

AU - Kolendovska, Marina

N1 - Conference code: 29

PY - 2020/6/1

Y1 - 2020/6/1

N2 - Laser-based scanners are widely used in state of the art technologies that obtain physic dimensions of the environment. Either for positioning purposes or 3D scanning of surfaces and objects, laser scanners have become very powerful tools in these areas. In terms of new and novel laser scanners, it's important to have some ways to determine statistical data that supports its reliability. Therefore the development of ways, methods, and tools that can help in this analysis becomes important.

AB - Laser-based scanners are widely used in state of the art technologies that obtain physic dimensions of the environment. Either for positioning purposes or 3D scanning of surfaces and objects, laser scanners have become very powerful tools in these areas. In terms of new and novel laser scanners, it's important to have some ways to determine statistical data that supports its reliability. Therefore the development of ways, methods, and tools that can help in this analysis becomes important.

KW - Laser Scanner

KW - Scanning plane equation

KW - Technical Vision System

KW - Engineering

UR - http://www.scopus.com/inward/record.url?scp=85089465186&partnerID=8YFLogxK

U2 - 10.1109/ISIE45063.2020.9152268

DO - 10.1109/ISIE45063.2020.9152268

M3 - Article in conference proceedings

AN - SCOPUS:85089465186

SN - 978-1-7281-5636-1

T3 - IEEE International Symposium on Industrial Electronics (ISIE)

SP - 1398

EP - 1403

BT - 2020 IEEE 29th International Symposium on Industrial Electronics (ISIE 2020)

A2 - null, IEEE Industrial Electronics Society (IES)

PB - IEEE - Institute of Electrical and Electronics Engineers Inc.

CY - Piscataway

T2 - 29th IEEE International Symposium on Industrial Electronics, ISIE 2020

Y2 - 17 June 2020 through 19 June 2020

ER -

DOI

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