Standard
Geometric analysis of a laser scanner functioning based on dynamic triangulation. / Sepulveda-Valdez, Cesar; Sergiyenko, Oleg; Tyrsa, Vera et al.
2020 IEEE 29th International Symposium on Industrial Electronics (ISIE 2020): 17 - 19 June, 2020, Delft, Netherlands, Proceedings . Hrsg. / IEEE Industrial Electronics Society (IES) . Piscataway : IEEE - Institute of Electrical and Electronics Engineers Inc., 2020. S. 1398-1403 9152268 (IEEE International Symposium on Industrial Electronics (ISIE); Band 2020).
Publikation: Beiträge in Sammelwerken › Aufsätze in Konferenzbänden › Forschung › begutachtet
Harvard
Sepulveda-Valdez, C, Sergiyenko, O, Tyrsa, V, Flores-Fuentes, W, Rodriguez-Quinonez, JC, Murrienta-Rico, FN, Miranda-Vega, JE
, Mercorelli, P & Kolendovska, M 2020,
Geometric analysis of a laser scanner functioning based on dynamic triangulation. in IEEEIES (Hrsg.),
2020 IEEE 29th International Symposium on Industrial Electronics (ISIE 2020): 17 - 19 June, 2020, Delft, Netherlands, Proceedings ., 9152268, IEEE International Symposium on Industrial Electronics (ISIE), Bd. 2020, IEEE - Institute of Electrical and Electronics Engineers Inc., Piscataway, S. 1398-1403, 29th IEEE International Symposium on Industrial Electronics, ISIE 2020, Delft, Niederlande,
17.06.20.
https://doi.org/10.1109/ISIE45063.2020.9152268APA
Sepulveda-Valdez, C., Sergiyenko, O., Tyrsa, V., Flores-Fuentes, W., Rodriguez-Quinonez, J. C., Murrienta-Rico, F. N., Miranda-Vega, J. E.
, Mercorelli, P., & Kolendovska, M. (2020).
Geometric analysis of a laser scanner functioning based on dynamic triangulation. in IEEE. I. E. S. (Hrsg.),
2020 IEEE 29th International Symposium on Industrial Electronics (ISIE 2020): 17 - 19 June, 2020, Delft, Netherlands, Proceedings (S. 1398-1403). [9152268] (IEEE International Symposium on Industrial Electronics (ISIE); Band 2020). IEEE - Institute of Electrical and Electronics Engineers Inc..
https://doi.org/10.1109/ISIE45063.2020.9152268Vancouver
Sepulveda-Valdez C, Sergiyenko O, Tyrsa V, Flores-Fuentes W, Rodriguez-Quinonez JC, Murrienta-Rico FN et al.
Geometric analysis of a laser scanner functioning based on dynamic triangulation. in IEEEIES, Hrsg., 2020 IEEE 29th International Symposium on Industrial Electronics (ISIE 2020): 17 - 19 June, 2020, Delft, Netherlands, Proceedings . Piscataway: IEEE - Institute of Electrical and Electronics Engineers Inc. 2020. S. 1398-1403. 9152268. (IEEE International Symposium on Industrial Electronics (ISIE)). doi: 10.1109/ISIE45063.2020.9152268
Bibtex
@inbook{e1b634fe67b345a286ea522535169a0f,
title = "Geometric analysis of a laser scanner functioning based on dynamic triangulation",
abstract = "Laser-based scanners are widely used in state of the art technologies that obtain physic dimensions of the environment. Either for positioning purposes or 3D scanning of surfaces and objects, laser scanners have become very powerful tools in these areas. In terms of new and novel laser scanners, it's important to have some ways to determine statistical data that supports its reliability. Therefore the development of ways, methods, and tools that can help in this analysis becomes important.",
keywords = "Laser Scanner, Scanning plane equation, Technical Vision System, Engineering",
author = "Cesar Sepulveda-Valdez and Oleg Sergiyenko and Vera Tyrsa and Wendy Flores-Fuentes and Rodriguez-Quinonez, {Julio Cesar} and Murrienta-Rico, {Fabian Natanael} and Miranda-Vega, {Jesus Elias} and Paolo Mercorelli and Marina Kolendovska",
year = "2020",
month = jun,
day = "1",
doi = "10.1109/ISIE45063.2020.9152268",
language = "English",
isbn = "978-1-7281-5636-1",
series = "IEEE International Symposium on Industrial Electronics (ISIE)",
publisher = "IEEE - Institute of Electrical and Electronics Engineers Inc.",
pages = "1398--1403",
editor = "{IEEE Industrial Electronics Society (IES) }",
booktitle = "2020 IEEE 29th International Symposium on Industrial Electronics (ISIE 2020)",
address = "United States",
note = "29th IEEE International Symposium on Industrial Electronics, ISIE 2020, ISIE 2020 ; Conference date: 17-06-2020 Through 19-06-2020",
url = "http://isie2020.org/",
}
RIS
TY - CHAP
T1 - Geometric analysis of a laser scanner functioning based on dynamic triangulation
AU - Sepulveda-Valdez, Cesar
AU - Sergiyenko, Oleg
AU - Tyrsa, Vera
AU - Flores-Fuentes, Wendy
AU - Rodriguez-Quinonez, Julio Cesar
AU - Murrienta-Rico, Fabian Natanael
AU - Miranda-Vega, Jesus Elias
AU - Mercorelli, Paolo
AU - Kolendovska, Marina
N1 - Conference code: 29
PY - 2020/6/1
Y1 - 2020/6/1
N2 - Laser-based scanners are widely used in state of the art technologies that obtain physic dimensions of the environment. Either for positioning purposes or 3D scanning of surfaces and objects, laser scanners have become very powerful tools in these areas. In terms of new and novel laser scanners, it's important to have some ways to determine statistical data that supports its reliability. Therefore the development of ways, methods, and tools that can help in this analysis becomes important.
AB - Laser-based scanners are widely used in state of the art technologies that obtain physic dimensions of the environment. Either for positioning purposes or 3D scanning of surfaces and objects, laser scanners have become very powerful tools in these areas. In terms of new and novel laser scanners, it's important to have some ways to determine statistical data that supports its reliability. Therefore the development of ways, methods, and tools that can help in this analysis becomes important.
KW - Laser Scanner
KW - Scanning plane equation
KW - Technical Vision System
KW - Engineering
UR - http://www.scopus.com/inward/record.url?scp=85089465186&partnerID=8YFLogxK
U2 - 10.1109/ISIE45063.2020.9152268
DO - 10.1109/ISIE45063.2020.9152268
M3 - Article in conference proceedings
AN - SCOPUS:85089465186
SN - 978-1-7281-5636-1
T3 - IEEE International Symposium on Industrial Electronics (ISIE)
SP - 1398
EP - 1403
BT - 2020 IEEE 29th International Symposium on Industrial Electronics (ISIE 2020)
A2 - null, IEEE Industrial Electronics Society (IES)
PB - IEEE - Institute of Electrical and Electronics Engineers Inc.
CY - Piscataway
T2 - 29th IEEE International Symposium on Industrial Electronics, ISIE 2020
Y2 - 17 June 2020 through 19 June 2020
ER -
