Experimental analysis of measurement process for a QCM using the pulse coincidence method

Publikation: Beiträge in SammelwerkenAufsätze in KonferenzbändenForschungbegutachtet

Standard

Experimental analysis of measurement process for a QCM using the pulse coincidence method. / Murrieta-Rico, Fabian N.; Petranovskii, Vitalii; Sergiyenko, Oleg et al.
IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society. Piscataway: IEEE - Institute of Electrical and Electronics Engineers Inc., 2019. S. 4657-4662 8927337 (IECON Proceedings (Industrial Electronics Conference); Band 2019-October).

Publikation: Beiträge in SammelwerkenAufsätze in KonferenzbändenForschungbegutachtet

Harvard

Murrieta-Rico, FN, Petranovskii, V, Sergiyenko, O, Mercorelli, P, Antúnez-Garcia, J, Sanchez-Lopez, JDD & Yocupicio-Gaxiola, RI 2019, Experimental analysis of measurement process for a QCM using the pulse coincidence method. in IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society., 8927337, IECON Proceedings (Industrial Electronics Conference), Bd. 2019-October, IEEE - Institute of Electrical and Electronics Engineers Inc., Piscataway, S. 4657-4662, 45th Annual Conference of the Institute of Electrical and Electronics Engineers' Industrial Electronics Society - 2019, Lisbon, Portugal, 14.10.19. https://doi.org/10.1109/IECON.2019.8927337

APA

Murrieta-Rico, F. N., Petranovskii, V., Sergiyenko, O., Mercorelli, P., Antúnez-Garcia, J., Sanchez-Lopez, J. D. D., & Yocupicio-Gaxiola, R. I. (2019). Experimental analysis of measurement process for a QCM using the pulse coincidence method. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society (S. 4657-4662). Artikel 8927337 (IECON Proceedings (Industrial Electronics Conference); Band 2019-October). IEEE - Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IECON.2019.8927337

Vancouver

Murrieta-Rico FN, Petranovskii V, Sergiyenko O, Mercorelli P, Antúnez-Garcia J, Sanchez-Lopez JDD et al. Experimental analysis of measurement process for a QCM using the pulse coincidence method. in IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society. Piscataway: IEEE - Institute of Electrical and Electronics Engineers Inc. 2019. S. 4657-4662. 8927337. (IECON Proceedings (Industrial Electronics Conference)). doi: 10.1109/IECON.2019.8927337

Bibtex

@inbook{332fdd551d1a42a29348f4713b88b351,
title = "Experimental analysis of measurement process for a QCM using the pulse coincidence method",
abstract = "Frequency measurement is one of the most important tasks in modern electrical metrology. In particular, for highly sensitive sensors with a frequency output, the resolution and sensitivity depends of the frequency measurement method used. The principle of rational approximations is a technique for frequency measurement, and its use has been proposed for application in sensors. In this work, a device which implements the principle of rational approximations is presented, and its characteristics are analyzed. Particularly, the system is used to measure the signal generated by a quartz crystal microbalance, and the relationship between the measured frequency, temperature and measurement time are evaluated.",
keywords = "Engineering, measurement time, QCM, Rational approximations",
author = "Murrieta-Rico, {Fabian N.} and Vitalii Petranovskii and Oleg Sergiyenko and Paolo Mercorelli and Joel Ant{\'u}nez-Garcia and Sanchez-Lopez, {Juan de Dios} and Yocupicio-Gaxiola, {Rosario I.}",
year = "2019",
month = oct,
doi = "10.1109/IECON.2019.8927337",
language = "English",
isbn = "978-1-7281-4879-3",
series = "IECON Proceedings (Industrial Electronics Conference)",
publisher = "IEEE - Institute of Electrical and Electronics Engineers Inc.",
pages = "4657--4662",
booktitle = "IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society",
address = "United States",
note = "45th Annual Conference of the Institute of Electrical and Electronics Engineers' Industrial Electronics Society - 2019, IECON'2019 ; Conference date: 14-10-2019 Through 17-10-2019",
url = "https://iecon2019.org/",

}

RIS

TY - CHAP

T1 - Experimental analysis of measurement process for a QCM using the pulse coincidence method

AU - Murrieta-Rico, Fabian N.

AU - Petranovskii, Vitalii

AU - Sergiyenko, Oleg

AU - Mercorelli, Paolo

AU - Antúnez-Garcia, Joel

AU - Sanchez-Lopez, Juan de Dios

AU - Yocupicio-Gaxiola, Rosario I.

N1 - Conference code: 45

PY - 2019/10

Y1 - 2019/10

N2 - Frequency measurement is one of the most important tasks in modern electrical metrology. In particular, for highly sensitive sensors with a frequency output, the resolution and sensitivity depends of the frequency measurement method used. The principle of rational approximations is a technique for frequency measurement, and its use has been proposed for application in sensors. In this work, a device which implements the principle of rational approximations is presented, and its characteristics are analyzed. Particularly, the system is used to measure the signal generated by a quartz crystal microbalance, and the relationship between the measured frequency, temperature and measurement time are evaluated.

AB - Frequency measurement is one of the most important tasks in modern electrical metrology. In particular, for highly sensitive sensors with a frequency output, the resolution and sensitivity depends of the frequency measurement method used. The principle of rational approximations is a technique for frequency measurement, and its use has been proposed for application in sensors. In this work, a device which implements the principle of rational approximations is presented, and its characteristics are analyzed. Particularly, the system is used to measure the signal generated by a quartz crystal microbalance, and the relationship between the measured frequency, temperature and measurement time are evaluated.

KW - Engineering

KW - measurement time

KW - QCM

KW - Rational approximations

UR - http://www.scopus.com/inward/record.url?scp=85084044827&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/95adb931-0fd2-3d76-8d85-e5679befcd02/

U2 - 10.1109/IECON.2019.8927337

DO - 10.1109/IECON.2019.8927337

M3 - Article in conference proceedings

SN - 978-1-7281-4879-3

T3 - IECON Proceedings (Industrial Electronics Conference)

SP - 4657

EP - 4662

BT - IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society

PB - IEEE - Institute of Electrical and Electronics Engineers Inc.

CY - Piscataway

T2 - 45th Annual Conference of the Institute of Electrical and Electronics Engineers' Industrial Electronics Society - 2019

Y2 - 14 October 2019 through 17 October 2019

ER -

DOI