Combining Model Predictive and Adaptive Control for an Atomic Force Microscope Piezo-Scanner-Cantilever System

Research output: Contributions to collected editions/worksArticle in conference proceedingsResearchpeer-review

Standard

Combining Model Predictive and Adaptive Control for an Atomic Force Microscope Piezo-Scanner-Cantilever System. / Fuhrhop, Carlos; Mercorelli, Paolo; Georgiadis, Anthimos.
2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics (SLED/PRECEDE) : 2013 IEEE International Symposium. IEEE - Institute of Electrical and Electronics Engineers Inc., 2013. 6684499 (SLED/PRECEDE 2013 - 2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics).

Research output: Contributions to collected editions/worksArticle in conference proceedingsResearchpeer-review

Harvard

Fuhrhop, C, Mercorelli, P & Georgiadis, A 2013, Combining Model Predictive and Adaptive Control for an Atomic Force Microscope Piezo-Scanner-Cantilever System. in 2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics (SLED/PRECEDE) : 2013 IEEE International Symposium., 6684499, SLED/PRECEDE 2013 - 2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics, IEEE - Institute of Electrical and Electronics Engineers Inc., International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics (SLED/PRECEDE) - IEEE 2013, München, Germany, 17.10.13. https://doi.org/10.1109/SLED-PRECEDE.2013.6684499

APA

Fuhrhop, C., Mercorelli, P., & Georgiadis, A. (2013). Combining Model Predictive and Adaptive Control for an Atomic Force Microscope Piezo-Scanner-Cantilever System. In 2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics (SLED/PRECEDE) : 2013 IEEE International Symposium Article 6684499 (SLED/PRECEDE 2013 - 2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics). IEEE - Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SLED-PRECEDE.2013.6684499

Vancouver

Fuhrhop C, Mercorelli P, Georgiadis A. Combining Model Predictive and Adaptive Control for an Atomic Force Microscope Piezo-Scanner-Cantilever System. In 2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics (SLED/PRECEDE) : 2013 IEEE International Symposium. IEEE - Institute of Electrical and Electronics Engineers Inc. 2013. 6684499. (SLED/PRECEDE 2013 - 2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics). doi: 10.1109/SLED-PRECEDE.2013.6684499

Bibtex

@inbook{26a24298493648ce8d85462a79bbeefd,
title = "Combining Model Predictive and Adaptive Control for an Atomic Force Microscope Piezo-Scanner-Cantilever System",
abstract = "The paper presents a new control algorithm which consists of a combination of an adaptive control structure and a model predictive one. An atomic force microscope in the contact mode (AFM) is considered to validate the proposed algorithm. The AFM is a powerful tool to measure the topography of the sample at the scale of a few nanometers, where a small sharp tip supported in a micro cantilever scans the surface. In the contact mode the samples topography is obtained while the closed-loop control holding the tip sample force constant. The dynamics of the tip-sample system is very complex with different kinds of forces that act between the tip and the sample. Here the dominated force depends on the distance tip-sample and in the present work we use a modified Hertz model to describe the non-linear force when the distance tip-sample is less than 20 nm. The proposed control technique consists of a two stage structure algorithm. In the control strategy, the adaptive part is devoted to the control of the non-linear dynamics, the model predictive part improves the transient of the overall control system in order to have a fast control of the complex tip-sample system. The procedure is totally general and can be applied to any drive system.",
keywords = "Engineering, Adaptive Control, AFM Cantilever Model, Model Predictive Control",
author = "Carlos Fuhrhop and Paolo Mercorelli and Anthimos Georgiadis",
year = "2013",
month = oct,
doi = "10.1109/SLED-PRECEDE.2013.6684499",
language = "English",
isbn = "9781479906819",
series = "SLED/PRECEDE 2013 - 2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics",
publisher = "IEEE - Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics (SLED/PRECEDE)",
address = "United States",
note = "International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics (SLED/PRECEDE) - IEEE 2013 ; Conference date: 17-10-2013 Through 19-10-2013",

}

RIS

TY - CHAP

T1 - Combining Model Predictive and Adaptive Control for an Atomic Force Microscope Piezo-Scanner-Cantilever System

AU - Fuhrhop, Carlos

AU - Mercorelli, Paolo

AU - Georgiadis, Anthimos

N1 - Conference code: 2

PY - 2013/10

Y1 - 2013/10

N2 - The paper presents a new control algorithm which consists of a combination of an adaptive control structure and a model predictive one. An atomic force microscope in the contact mode (AFM) is considered to validate the proposed algorithm. The AFM is a powerful tool to measure the topography of the sample at the scale of a few nanometers, where a small sharp tip supported in a micro cantilever scans the surface. In the contact mode the samples topography is obtained while the closed-loop control holding the tip sample force constant. The dynamics of the tip-sample system is very complex with different kinds of forces that act between the tip and the sample. Here the dominated force depends on the distance tip-sample and in the present work we use a modified Hertz model to describe the non-linear force when the distance tip-sample is less than 20 nm. The proposed control technique consists of a two stage structure algorithm. In the control strategy, the adaptive part is devoted to the control of the non-linear dynamics, the model predictive part improves the transient of the overall control system in order to have a fast control of the complex tip-sample system. The procedure is totally general and can be applied to any drive system.

AB - The paper presents a new control algorithm which consists of a combination of an adaptive control structure and a model predictive one. An atomic force microscope in the contact mode (AFM) is considered to validate the proposed algorithm. The AFM is a powerful tool to measure the topography of the sample at the scale of a few nanometers, where a small sharp tip supported in a micro cantilever scans the surface. In the contact mode the samples topography is obtained while the closed-loop control holding the tip sample force constant. The dynamics of the tip-sample system is very complex with different kinds of forces that act between the tip and the sample. Here the dominated force depends on the distance tip-sample and in the present work we use a modified Hertz model to describe the non-linear force when the distance tip-sample is less than 20 nm. The proposed control technique consists of a two stage structure algorithm. In the control strategy, the adaptive part is devoted to the control of the non-linear dynamics, the model predictive part improves the transient of the overall control system in order to have a fast control of the complex tip-sample system. The procedure is totally general and can be applied to any drive system.

KW - Engineering

KW - Adaptive Control

KW - AFM Cantilever Model

KW - Model Predictive Control

UR - http://www.scopus.com/inward/record.url?scp=84894448933&partnerID=8YFLogxK

U2 - 10.1109/SLED-PRECEDE.2013.6684499

DO - 10.1109/SLED-PRECEDE.2013.6684499

M3 - Article in conference proceedings

SN - 9781479906819

T3 - SLED/PRECEDE 2013 - 2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics

BT - 2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics (SLED/PRECEDE)

PB - IEEE - Institute of Electrical and Electronics Engineers Inc.

T2 - International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics (SLED/PRECEDE) - IEEE 2013

Y2 - 17 October 2013 through 19 October 2013

ER -

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