Combining Model Predictive and Adaptive Control for an Atomic Force Microscope Piezo-Scanner-Cantilever System
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2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics (SLED/PRECEDE) : 2013 IEEE International Symposium. IEEE - Institute of Electrical and Electronics Engineers Inc., 2013. 6684499 (SLED/PRECEDE 2013 - 2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics).
Research output: Contributions to collected editions/works › Article in conference proceedings › Research › peer-review
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TY - CHAP
T1 - Combining Model Predictive and Adaptive Control for an Atomic Force Microscope Piezo-Scanner-Cantilever System
AU - Fuhrhop, Carlos
AU - Mercorelli, Paolo
AU - Georgiadis, Anthimos
N1 - Conference code: 2
PY - 2013/10
Y1 - 2013/10
N2 - The paper presents a new control algorithm which consists of a combination of an adaptive control structure and a model predictive one. An atomic force microscope in the contact mode (AFM) is considered to validate the proposed algorithm. The AFM is a powerful tool to measure the topography of the sample at the scale of a few nanometers, where a small sharp tip supported in a micro cantilever scans the surface. In the contact mode the samples topography is obtained while the closed-loop control holding the tip sample force constant. The dynamics of the tip-sample system is very complex with different kinds of forces that act between the tip and the sample. Here the dominated force depends on the distance tip-sample and in the present work we use a modified Hertz model to describe the non-linear force when the distance tip-sample is less than 20 nm. The proposed control technique consists of a two stage structure algorithm. In the control strategy, the adaptive part is devoted to the control of the non-linear dynamics, the model predictive part improves the transient of the overall control system in order to have a fast control of the complex tip-sample system. The procedure is totally general and can be applied to any drive system.
AB - The paper presents a new control algorithm which consists of a combination of an adaptive control structure and a model predictive one. An atomic force microscope in the contact mode (AFM) is considered to validate the proposed algorithm. The AFM is a powerful tool to measure the topography of the sample at the scale of a few nanometers, where a small sharp tip supported in a micro cantilever scans the surface. In the contact mode the samples topography is obtained while the closed-loop control holding the tip sample force constant. The dynamics of the tip-sample system is very complex with different kinds of forces that act between the tip and the sample. Here the dominated force depends on the distance tip-sample and in the present work we use a modified Hertz model to describe the non-linear force when the distance tip-sample is less than 20 nm. The proposed control technique consists of a two stage structure algorithm. In the control strategy, the adaptive part is devoted to the control of the non-linear dynamics, the model predictive part improves the transient of the overall control system in order to have a fast control of the complex tip-sample system. The procedure is totally general and can be applied to any drive system.
KW - Engineering
KW - Adaptive Control
KW - AFM Cantilever Model
KW - Model Predictive Control
UR - http://www.scopus.com/inward/record.url?scp=84894448933&partnerID=8YFLogxK
U2 - 10.1109/SLED-PRECEDE.2013.6684499
DO - 10.1109/SLED-PRECEDE.2013.6684499
M3 - Article in conference proceedings
SN - 9781479906819
T3 - SLED/PRECEDE 2013 - 2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics
BT - 2013 IEEE International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics (SLED/PRECEDE)
PB - IEEE - Institute of Electrical and Electronics Engineers Inc.
T2 - International Symposium on Sensorless Control for Electrical Drives and Predictive Control of Electrical Drives and Power Electronics (SLED/PRECEDE) - IEEE 2013
Y2 - 17 October 2013 through 19 October 2013
ER -