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  1. IEEE Electron Device Letters

    ISSNs: 0741-3106, 0193-8576

    Institute of Electrical and Electronics Engineers Inc.

    Scopus rating (2023): CiteScore 8.2 SJR 1.25 SNIP 1.5

    Journal

  2. IEEE Embedded Systems Letters

    ISSNs: 1943-0663

    Institute of Electrical and Electronics Engineers Inc.

    Scopus rating (2023): CiteScore 3.3 SJR 0.455 SNIP 0.703

    Journal

  3. IEEE Geoscience and Remote Sensing Letters

    ISSNs: 1545-598X

    Additional searchable ISSN (electronic): 1558-0571

    Institute of Electrical and Electronics Engineers Inc., United States

    Scopus rating (2023): CiteScore 7.6 SJR 1.248 SNIP 1.24

    Journal

  4. IEEE International Workshop on Computer Aided Modeling and Design of Communication Links and Networks, CAMAD

    Additional searchable ISSN (electronic): 2378-4873

    Institute of Electrical and Electronics Engineers Inc.

    Journal

  5. IEEE International Workshop on Machine Learning for Signal Processing, MLSP

    ISSNs: 2161-0363

    Additional searchable ISSN (electronic): 2161-0371

    IEEE - Institute of Electrical and Electronics Engineers Inc.

    Journal

  6. IEEE Latin America Transactions

    ISSNs: 1548-0992

    Additional searchable ISSN (electronic): 1548-0992

    IEEE - Institute of Electrical and Electronics Engineers Inc., United States

    Scopus rating (2023): CiteScore 3.5 SJR 0.37 SNIP 0.574

    Journal

  7. IEEE LTS

    ISSNs: 1055-6877

    IEEE Communications Society

    Journal

  8. IEEE Magnetics Letters

    ISSNs: 1949-307X

    Institute of Electrical and Electronics Engineers Inc.

    Scopus rating (2023): CiteScore 2.4 SJR 0.314 SNIP 0.505

    Journal

  9. IEEE Microwave and Wireless Technology Letters

    ISSNs: 2771-957X, 1531-1309, 1558-1764, 1051-8207

    Additional searchable ISSN (electronic): 2771-9588

    Institute of Electrical and Electronics Engineers Inc.

    Journal

  10. IEEE Networking Letters

    Additional searchable ISSN (electronic): 2576-3156

    Institute of Electrical and Electronics Engineers Inc.

    Journal